| Technical Specifications |
| Test Range |
10 mm to 5 meter (0.500 in to 200 in) (in steel). In Hot Key mode it has 13 preset values. Fine mode adjustable in step of 1mm (0.2 in). |
| Velocity |
1000 m/sec to 9999 m/sec (0.0400 in/s to 0.4000 in/s). In Hot Key mode it has 7 preset values. Fine mode adjustable in step of 1 met/sec (0.0001 in/s). |
| Delay |
Variable from 0 to 3000 mm (0 to 100 in). In Hot Key mode 5 mm (0.2 in).Fine mode adjustable in step of 0.5 mm (0.02 in). |
| Gain |
100 dB calibrated gain adjustable in 0.5, 1, 2, 6, 12 or 20 dB step. |
| Rejection |
0 to 100% FSH with LED indicator. |
| Rectification |
Full-wave rectified with filtering. |
| Frequency |
Broad Band amplifier 0.5 MHz to 15 MHz. |
| Test Modes |
Pulse echo and transmit/receive. |
| Transmitter |
Transmission pulse Negative spike with selectable high or low power. |
| Damping |
Damping high / low is selectable. |
| Freeze/Peak Freeze |
A- Scan Freeze and Peak Freeze available. In Peak freeze it holds echo dynamic pattern which is useful during angle beam probing to locate peak signal. |
| Connectors |
BNC and LEMO(Size 1) both are provided. |
| Monitor |
Dual gate adjustable in 1% of Screen width with Positive/Negative logic, Gate Expand modes. |
| Gate Expand |
Expands Range to width of the gate. |
| A-Scan memory |
200 Trace Patterns can be stored (with Note/Detail) recalled, printed or transferred to PC via RS-232 serial port. |
| Calibration Set-up |
50 different calibration set-ups can be Stored and Recalled. |
| Software |
EinSoft DGS Interface software for transferring A-Scan from Einstein-II DGS to PC is supplied. |
| Printer Attachment |
IBM compatible Printer having serial port can be directly attached to main unit for printing of stored A-Scan waveform with calibration data. |
| Display |
High brightness Colour LCD/TFT Display. Display area 320×240 pixel(122x92mm). Eleven different color scheme option. |
| Full Screen |
By pressing Zoom keyA-Scan can be displayed in Full Screen area. |
| ReferenceA-Scan |
Reference A-Scan pattern of standard test object can saved and recalled in the background for easy comparision during testing. |
| DAC |